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atpg slot Let us explore the most prevalent DFT approach for logic testing, known as Scan and ATPG in VLSI Click to read more

Tessent Scan and ATPG User's Manual Software Version September 2014 This manual is part of a fully-indexed Tessent documentation set

ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test (full scan,

Tessent Scan and ATPG User's Manual Software Version September 2014 This manual is part of a fully-indexed Tessent documentation set

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It creates & embeds the test compression logic into the design It further extends ATPG to generate compressed test patterns & reduces the test