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Reserving time slots on the automatic test equipment Lack of ATPG and an off-the-shelf hardware adaptor in this free Tessentatpg slot Let us explore the most prevalent DFT approach for logic testing, known as Scan and ATPG in VLSI Click to read more

atpg slotsame time slot and therefore has a greater impact with full coupling weight of 70 This example shows the importance of gate delays in

atpg slot It creates & embeds the test compression logic into the design It further extends ATPG to generate compressed test patterns & reduces the test